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Nondestructive layer-thickness evaluation
David S. Citrin from the Georgia Institute of Technology (USA) has recently reported on a new approach for a paint thickness measurement technique.
The technique is based on time-domain terahertz reflectometry with which three-dimensional information about objects is obtainable. The discussed work focuses on detecting subsurface damage in carbon fiber composites and in measuring paint-layer thickness down to ~20 microns. In the publication the research group´s approaches to overcome certain limitations of the measurement technique are discussed. These rely upon applying advanced signal-processing techniques to extract the maximum information from the detected signals.
Further information:
Proceedings Volume 10917, Terahertz, RF,
Millimeter, and Submillimeter-Wave Technology and Applications XII;
1091717 (2019) https://doi.org/10.1117/12.2513540
Event: SPIE OPTO, 2019, San Francisco, California, United States